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Advances in Imaging and Electron Physics: Electron Emission Physics Volume 149
Contributor(s): Jensen, Kevin (Author), Hawkes, Peter W. (Editor)

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 ISBN: 0123742072     ISBN-13: 9780123742070
Publisher: Academic Press
OUR PRICE: $261.25  

Binding Type: Hardcover - See All Available Formats & Editions
Published: November 2007
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Annotation: Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains

Click for more in this series: Advances in Imaging & Electron Physics
Additional Information
BISAC Categories:
- Science | Electron Microscopes & Microscopy
- Science | Microscopes & Microscopy
- Technology & Engineering | Imaging Systems
Dewey: 621.367
Series: Advances in Imaging & Electron Physics
Physical Information: 0.88" H x 6.56" W x 9.07" L (1.54 lbs) 360 pages
Features: Bibliography, Illustrated, Index, Table of Contents
 
Descriptions, Reviews, Etc.
Publisher Description:
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

This thematic volume is on the topic of Field-emission Source Mechanisms and is authored by Kevin Jensen, Naval Research Laboratory, Washington, DC.
 
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