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Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications
Contributor(s): Haugstad, Greg (Author)

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ISBN: 0470638826     ISBN-13: 9780470638828
Publisher: Wiley
OUR PRICE: $161.45  

Binding Type: Hardcover - See All Available Formats & Editions
Published: September 2012
Qty:
Additional Information
BISAC Categories:
- Science | Microscopes & Microscopy
- Technology & Engineering | Nanotechnology & Mems
Dewey: 620.5
LCCN: 2012003429
Physical Information: 1.2" H x 6.2" W x 9.3" L (1.75 lbs) 496 pages
Features: Bibliography, Illustrated, Index
 
Descriptions, Reviews, Etc.
Publisher Description:
This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.

"Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com"

 
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