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Advanced Mathematical and Computational Tools in Metrology VI
Contributor(s): Ciarlini, Patrizia (Editor), Cox, Maurice G. (Editor), Pavese, Franco (Editor)

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 ISBN: 9812389040     ISBN-13: 9789812389046
Publisher: World Scientific Publishing Company
OUR PRICE: $183.35  

Binding Type: Hardcover - See All Available Formats & Editions
Published: July 2004
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Temporarily out of stock - Will ship within 2 to 5 weeks

Annotation: - Promotes effective mathematical and computational tools in metrology
- Clarifies the modelling, statistical and computational requirements in metrology
- Assists young researchers in metrology and related fields
- Addresses industrial requirements

Click for more in this series: Advances in Mathematics for Applied Sciences
Additional Information
BISAC Categories:
- Mathematics | Probability & Statistics - General
- Mathematics | Applied
Dewey: 519.2
Series: Advances in Mathematics for Applied Sciences
Physical Information: 0.98" H x 6.12" W x 9.22" L (1.37 lbs) 368 pages
 
Descriptions, Reviews, Etc.
Publisher Description:
This volume collects refereed contributions based on the presentations made at the Sixth Workshop on Advanced Mathematical and Computational Tools in Metrology, held at the Istituto di Metrologia "G. Colonnetti" (IMGC), Torino, Italy, in September 2003. It provides a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources, and promotes collaboration in the context of EU programmes, EUROMET and EA projects, and MRA requirements. It contains articles by an important, worldwide group of metrologists and mathematicians involved in measurement science and, together with the five previous volumes in this series, constitutes an authoritative source for the mathematical, statistical and software tools necessary to modern metrology.The proceedings have been selected for coverage in: Index to Scientific & Technical Proceedings(R) (ISTP(R) / ISI Proceedings)Index to Scientific & Technical Proceedings (ISTP CDROM version / ISI Proceedings)CC Proceedings -- Engineering & Physical Sciences
 
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