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Atomic Force Microscopy in Adhesion Studies
Contributor(s): Drelich, J. (Editor), Mittal, Kash L. (Editor)

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 ISBN: 906764434X     ISBN-13: 9789067644341
Publisher: CRC Press
OUR PRICE: $356.25  

Binding Type: Hardcover - See All Available Formats & Editions
Published: October 2005
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Temporarily out of stock - Will ship within 2 to 5 weeks

Annotation: Over 100 authors contributed to this book, summarizing current status of research on measurements of colloidal particle-solid adhesion and molecular forces, solid surface imaging and mapping, and discussing the contact mechanics models applicable to particle-substrate and particle-particle systems.
Additional Information
BISAC Categories:
- Science | Microscopes & Microscopy
- Science | Chemistry - Physical & Theoretical
Dewey: 502.82
LCCN: 2006276696
Physical Information: 822 pages
 
Descriptions, Reviews, Etc.
Publisher Description:
Since its discovery, Atomic Force Microscopy (AFM) has become a technique of choice for non-destructive surface characterization with sub-molecular resolution. The AFM has also emerged as a problem-solving tool in applications relevant to particle-solid and particle-liquid interactions, design, fabrication, and characterization of new materials, and development of new technologies for processing and modification of materials. This volume is a comprehensive review of AFM techniques and their application in adhesion studies. It is intended for both researchers and students in engineering disciplines, physics and biology. Over 100 authors contributed to this book, summarizing current status of research on measurements of colloidal particle-solid adhesion and molecular forces, solid surface imaging and mapping, and discussing the contact mechanics models applicable to particle-substrate and particle-particle systems.
 
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