Atom Probe Microscopy 2012 Edition Contributor(s): Gault, Baptiste (Author), Moody, Michael P. (Author), Cairney, Julie M. (Author) |
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ISBN: 1461434351 ISBN-13: 9781461434351 Publisher: Springer
Binding Type: Hardcover - See All Available Formats & Editions Published: May 2012 Click for more in this series: Springer Materials Science |
Additional Information |
BISAC Categories: - Science | Microscopes & Microscopy - Technology & Engineering | Materials Science - General - Technology & Engineering | Nanotechnology & Mems |
Dewey: 502.82 |
LCCN: 2012936826 |
Series: Springer Materials Science |
Physical Information: 1.3" H x 6.4" W x 9.3" L (1.65 lbs) 396 pages |
Features: Bibliography, Illustrated, Index, Maps |
Descriptions, Reviews, Etc. |
Publisher Description: Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument's capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy--including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.
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