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Aberration-Corrected Analytical Transmission Electron Microscopy
Contributor(s): Brydson, Rik (Editor)

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 ISBN: 0470518510     ISBN-13: 9780470518519
Publisher: Wiley
OUR PRICE: $67.40  

Binding Type: Hardcover - See All Available Formats & Editions
Published: September 2011
Qty:

Click for more in this series: RMS - Royal Microscopical Society
Additional Information
BISAC Categories:
- Science | Electron Microscopes & Microscopy
- Science | Physics - Optics & Light
Dewey: 502.825
LCCN: 2011019731
Series: RMS - Royal Microscopical Society
Physical Information: 0.8" H x 6.2" W x 9.1" L (1.25 lbs) 304 pages
Features: Bibliography, Illustrated, Index, Table of Contents
 
Descriptions, Reviews, Etc.
Publisher Description:
The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).
 
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