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Atomic Force Microscopy
Contributor(s): Eaton, Peter (Author)

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ISBN: 0198826281     ISBN-13: 9780198826286
Publisher: Oxford University Press, USA
OUR PRICE: $57.95  

Binding Type: Paperback - See All Available Formats & Editions
Published: August 2018
Qty:
Temporarily out of stock - Will ship within 2 to 5 weeks
Additional Information
BISAC Categories:
- Science | Microscopes & Microscopy
- Science | Physics - General
- Science | Life Sciences - General
Dewey: 502.82
Physical Information: 0.6" H x 6.7" W x 9.6" L (1.19 lbs) 256 pages
 
Descriptions, Reviews, Etc.
Publisher Description:
Atomic force microscopy (AFM) is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make
measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution.

This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction, and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what
data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry demonstrate the different capabilities of the technique.

 
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