Atom Probe Field Ion Microscopy Contributor(s): Miller, M. K. (Author), Cerezo, A. (Author), Hetherington, M. G. (Author) |
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ISBN: 0198513879 ISBN-13: 9780198513872 Publisher: Clarendon Press
Binding Type: Hardcover Published: November 1996 * Out of Print * Click for more in this series: Monographs on the Physics & Chemistry of Materials (Hardcover) |
Additional Information |
BISAC Categories: - Science | Microscopes & Microscopy - Science | Physics - General - Science | Research & Methodology |
Dewey: 502.82 |
LCCN: 95021967 |
Series: Monographs on the Physics & Chemistry of Materials (Hardcover) |
Physical Information: 1.19" H x 6.14" W x 9.21" L (2.01 lbs) 532 pages |
Features: Bibliography, Illustrated, Index, Table of Contents |
Descriptions, Reviews, Etc. |
Publisher Description: The atom probe technique permits the imaging and chemical identification of individual and solid surfaces. It is one of the most important experimental methods in the emerging field of atomic-scale science and technology. This book gives a definitive and up-to-date account of the field, and is written by leading authorities on the subject. It includes recent advances in the method which have allowed for new and exciting applications to emerge in the field of material science, surface science, and catalysis. The book is a state-of-the art account of this important field, and is intended for a graduate-level readership. |
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