Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 168 Contributor(s): Hawkes, Peter W. (Editor) |
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ISBN: 0123859832 ISBN-13: 9780123859839 Publisher: Academic Press
Binding Type: Hardcover Published: August 2011 Click for more in this series: Advances in Imaging & Electron Physics |
Additional Information |
BISAC Categories: - Science | Electron Microscopes & Microscopy - Science | Microscopes & Microscopy - Technology & Engineering | Imaging Systems |
Dewey: 621.367 |
Series: Advances in Imaging & Electron Physics |
Physical Information: 0.9" H x 6.1" W x 9.1" L (1.20 lbs) 392 pages |
Features: Bibliography, Illustrated, Index, Table of Contents |
Descriptions, Reviews, Etc. |
Publisher Description: Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. |
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