Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 162 Contributor(s): Hawkes, Peter W. (Editor) |
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ISBN: 0123813166 ISBN-13: 9780123813169 Publisher: Academic Press
Binding Type: Hardcover Published: June 2010 Click for more in this series: Advances in Imaging & Electron Physics |
Additional Information |
BISAC Categories: - Science | Electron Microscopes & Microscopy - Science | Microscopes & Microscopy - Technology & Engineering | Imaging Systems |
Dewey: 621.367 |
Series: Advances in Imaging & Electron Physics |
Physical Information: 0.8" H x 6.1" W x 9" L (1.15 lbs) 296 pages |
Features: Bibliography, Illustrated, Index, Table of Contents |
Descriptions, Reviews, Etc. |
Publisher Description: Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. |
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