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Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 162
Contributor(s): Hawkes, Peter W. (Editor)

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ISBN: 0123813166     ISBN-13: 9780123813169
Publisher: Academic Press
OUR PRICE: $247.00  

Binding Type: Hardcover
Published: June 2010
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Additional Information
BISAC Categories:
- Science | Electron Microscopes & Microscopy
- Science | Microscopes & Microscopy
- Technology & Engineering | Imaging Systems
Dewey: 621.367
Series: Advances in Imaging & Electron Physics
Physical Information: 0.8" H x 6.1" W x 9" L (1.15 lbs) 296 pages
Features: Bibliography, Illustrated, Index, Table of Contents
 
Descriptions, Reviews, Etc.
Publisher Description:

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

 
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