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Advances in Imaging and Electron Physics: The Scanning Transmission Electron Microscope Volume 159
Contributor(s): Hawkes, Peter W. (Editor)

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ISBN: 0123749867     ISBN-13: 9780123749864
Publisher: Academic Press
OUR PRICE: $273.00  

Binding Type: Hardcover
Published: November 2009
Qty:
Additional Information
BISAC Categories:
- Science | Electron Microscopes & Microscopy
- Science | Microscopes & Microscopy
- Technology & Engineering | Imaging Systems
Dewey: 621.367
Physical Information: 1.3" H x 6.2" W x 9" L (1.75 lbs) 320 pages
Features: Bibliography, Illustrated, Index, Table of Contents
 
Descriptions, Reviews, Etc.
Publisher Description:
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope.
 
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